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 | Ismet Bayraktaroglu and Alex Orailoglu.
``Gate Level Fault Diagnosis in Scan-Based BIST''
Proceedings of IEEE Design, Automation and Test in Europe Conference,
April 2002, pp. 376-381. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Rapid Fault Diagnosis through Cost-Effective
Deterministic Partitioning in Scan-Based BIST''
IEEE Design & Test of Computers,
Vol. 19, No. 1,
January-February 2002, pp. 42-53. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Selecting a PRPG: Randomness, Primitiveness, or Sheer Luck?''
Proceedings of the IEEE Asian Test Symposium,
November 2001, pp. 373-378. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Diagnosis for Scan-Based BIST:
Reaching Deep into the Signatures'',
Proceedings of IEEE Design, Automation and Test in Europe Conference,
March 2001, pp. 102-109. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST''
Proceedings of the IEEE International Test Conference,
Atlantic City, NJ, October 2000, pp. 273-282. [pdf]
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| Ismet Bayraktaroglu and Alex Orailoglu.
``Improved Fault Diagnosis in Scan-Based BIST via Superposition''
Proceedings of the IEEE/ACM Design Automation Conference,
Los Angeles, California, June 2000, pp. 55-58. [pdf]
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