 | Baris Arslan and Alex Orailoglu.
``Design Space Exploration for Aggressive Test Cost
Reduction in Circular Scan Architectures''
Proceedings of the IEEE International Conference
on
Computer-Aided Design (ICCAD) ,
November 2004.
|
| Baris Arslan, Ozgur Sinanoglu and Alex Orailoglu.
``Extending the Applicability of Parallel-Serial Scan Designs''
Proceedings of the IEEE International
Conference on Computer Design (ICCD) ,
October 2004, pp.200-203.
|
| Baris Arslan and Alex Orailoglu.
``Test Cost Reduction Through A Reconfigurable Scan Architecture''
Proceedings of the IEEE International Test Conference
(ITC) ,
October 2004.
|
| Baris Arslan and Alex Orailoglu.
``CircularScan: A Scan Architecture for Test Cost Reduction''
Proceedings of the
IEEE Design, Automation and Test in Europe Conference
(DATE) ,
February 2004, pp. 1290-1295.[pdf]
|
| Baris Arslan and Alex Orailoglu.
``Extracting Precise Diagnosis of Bridging Faults
from Stuck-at Fault Information''
Proceedings of the IEEE Asian Test Symposium
(ATS) ,
November 2003, pp. 230-235. [pdf]
|
| Baris Arslan and Alex Orailoglu.
``Perfect Conservation of Diagnosic Information in Aggressive
Reduction of SOC Test Bandwidth and Use''
Formal Proceedings of the
IEEE Europian Test Workshop (ETS) ,
May 2003, pp. 13-14. [pdf]
|
| Baris Arslan and Alex Orailoglu.
``Aggressive SOC Test Response Compaction with Full Diagnostic Information Conservation''
presented in International Test Synthesis Workshop
(ITSW) ,
February 2003. [pdf]
|
| Baris Arslan and Alex Orailoglu.
``Fault Dictionary Size Reduction through Test Response
Superposition''
Proceedings of the IEEE International Conference on Computer Design: VLSI in
Computers (ICCD) ,
September 2002, pp. 480-485. [pdf] |
