PUBLICATIONS


Journals:

  • Ayse K. Coskun, Tajana Simunic Rosing, Keith Whisnant and Kenny Gross. Static and Dynamic Temperature-Aware Scheduling for Multiprocessor SoCs. To appear in IEEE Transactions on VLSI, 2008.
  • Ayse K. Coskun, Tajana Simunic Rosing, Kresimir Mihic, Yusuf Leblebici and Giovanni De Micheli. Analysis and Optimization of MPSoC Reliability. In Journal of Low Power Electronics (JOLPE), April 2006. <pdf>

Conferences:

  • Ayse K. Coskun, Tajana Simunic Rosing and Kenny Gross. Proactive Temperature Balancing for Low Cost Thermal Management in MPSoCs. To appear in Proceedings of International Conference on Computer-Aided Design (ICCAD), 2008.
  • Ayse K. Coskun, Tajana Simunic Rosing and Kenny Gross. Proactive Temperature Management in MPSoCs. To appear in Proceedings of International Symposium on Low Power Electronics and Design (ISLPED), 2008. <pdf>
  • Ayse K. Coskun, Tajana Simunic Rosing and Kenny Gross. Temperature Management in Multiprocessor SoCs Using Online Learning. In Proceedings of Design Automation Conference (DAC), 2008. <pdf>
  • Ayse K. Coskun, Tajana Simunic Rosing, Keith Whisnant and Kenny Gross. Temperature-Aware MPSoC Scheduling for Reducing Hot Spots and Gradients. In Proceedings of Asia and South Pacific Design Automation Conference (ASPDAC), 2008. <pdf>
  • Ayse K. Coskun, Tajana Simunic Rosing and Keith Whisnant. Temperature Aware Task Scheduling in MPSoCs. In Proceedings of Design Automation and Test in Europe (DATE), 2007.<pdf>
  • Satish Narayanasamy, Ayse K. Coskun and Brad Calder. Transient Fault Prediction Based on Anomalies in Processor Events. In Proceedings of Design Automation and Test in Europe (DATE), 2007.<pdf>
  • Ayse K. Coskun, Tajana Simunic Rosing, Yusuf Leblebici and Giovanni De Micheli. A Simulation Methodology for Reliability Analysis in Multi-Core SoCs. In Great Lakes Symposium on VLSI (GLSVLSI), 2006. <pdf>


Patents:

  • Ayse K. Coskun, Kenny Gross and Keith Whisnant. Temperature-Aware and Energy-Aware Scheduling in a Computer System. Pending, October 2007.
  • Kenny Gross, Keith Whisnant and Ayse K. Coskun. Length-of-the-Curve Stress Metric for Improved Computer System Reliability Characterization. Pending, 2007.